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Our spectroscopy suite is equipped with an array of instruments which allow for chemical analysis for quantifying elemental composition and analysing bonding structures.



Perkin Elmer FTIR system for chemical analysis of organic materials and functional groups

Perkin Elmer Spectrum One Fourier Transform Infrared (FTIR) spectrometer, and Spotlight Imaging FTIR microscope. We also have a Specac Golden Gate accessory, with a single reflection 45° diamond ATR.

  • The ATR has diamond and germanium crystals for a wider material analysis range
  • The spotlight system allows for mapping and identification of individual micro-particles with spatial resolution of 10µm


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Renishaw Invia Raman Spectrascope

Raman system with 514nm laser

Renishaw Invia Micro Raman system fitted with a 514nm laser allows for detailed analysis of carbon as well as determining the chemical structure of many materials.

  • Ideal for carbon material analysis
  • Minimal sample preparation
  • Non-destructive
  • Linefocus mode for particle mapping
  • Analyse stresses in addition to chemistry




TOF-SIMS produced by KORE Technology

Kore SurfaceSeer Time of Flight – Secondary Ion Mass Spectrometer (ToF-SIMS) is a state of the art spectrometer that allows for the simultaneous analysis of elements and molecular fragments of a surface. The most sensitive of all the commonly-employed surface analytical techniques, SIMS provides a unique combination of high sensitivity for atoms (from Hydrogen to Uranium), clusters of atoms and molecular fragments.

  • 1-2 nanometre surface penetration
  • High sensitivity
  • Full atomic range
  • Spatially-resolved analysis



PerkinElmer Lambda 1050(+) UV/Vis/NIR

The PerkinElmer Lambda 1050(+) spectrophotometer offers high performance and flexibility for sample analysis

Perkin Elmer Lambda 1050(+) provides further sample analysis capabilities of coatings, glass, solar, modern materials and components.

  • 2D 150mm InGaAs system
  • 2500nm - 3300nm wavelength range